ZARUL FITRI ZABA; IDYAWATI HUSSEIN. Variable-to-Variable Run Length Encoding Technique for Testing Low Power VLSI Circuits. IIRJET, [S. l.], v. 5, n. 2, 2022. DOI: 10.32595/iirjet.org/v5i2.2019.104. Disponível em: http://iirjet.org/index.php/home/article/view/104. Acesso em: 3 may. 2024.